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Compact NIR Solutions for Material Analysis

Enable non-destructive NIR material analysis anywhere & across various applications with Si-Ware Systems diverse portfolio of miniaturized NIR solutions. Our portfolio includes the world’s most compact lab-grade NIR OEM sensors and a field-ready inline/online continuous analyzer, all featuring the widest NIR wave length  (1,350–2,550 nm) in compact form.

Cost-effective

User-friendly Software

Easy Evaluation & Deployment

End-to-end Engineering Support

Five different Si-NIR spectrometer devices against a blue background with white line graphs above them.

TRUSTED, VALIDATED, & USED BY INDUSTRY LEADERS

Proven Leadership in Miniaturized Spectral Sensing Technology

20+
years of innovations
130+
patents
15,000+
sensors delivered
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Our NIR Portfolio at a Glance

Close-up of a hand holding a portable spectrometer device with a detachable sensor on the left, and the device scanning different mineral samples on the right, with a spectral graph overlay.

OEM NIR Sensors & DVKs

Compact FT-NIR sensor/spectrometer ready for integration + plug & play development kits to test their material sensing capabilities

Two black Envir streamLine air quality sensors mounted on metal ducting and outdoor equipment with cables attached.

Inline/Online NIR Analyzer

Industrial FT-NIR analyzer for continuous monitoring of material composition in real-time

Need to enable NIR material analysis in your products?
Meet Our NIR OEM Sensors

Create your own handheld NIR material analyzers and more with Si-NIR Mini and Si-NIR Matrix. They are compact OEM NIR spectral sensors/spectrometers designed for easy & cost-effective integration into portable devices, smart industrial equipment, automation systems, and more

Text reading 'Si-NIR Mini' with 'Si-NIR' in white inside a blue rounded rectangle and 'Mini' below in dark blue.

World’s smallest MEMS-based FT-NIR sensor for products with size limitations. Ideal for homogeneous materials like powders, liquids and thin films.


Small black electronic sensor module measuring 3 cm by 3 cm by 2 cm with a square opening on top.
Text reading 'Si-NIR Matrix' with 'Si-NIR' in a blue rounded rectangle and 'Matrix' in bold dark blue letters.

Compact FT-NIR sensor with a large sampling area for all kinds of materials including mixtures, pellets, and granular samples.

Compact cylindrical electronic sensor mounted on a green circuit board with dimensions 6.4 cm by 4.5 cm by 6 cm.

Widest FT-NIR spectral range
(1,350–2,550 nm)

1-second analysis for instant results

Non-destructive testing with minimal sample preparation

Integration-ready electrical & optical interfaces

Various parameters in one scan

Designed for cost-sensitive, high-volume OEM products

Need to Test our sensors?

Si-NIR Mini DVK and Si-NIR Matrix DVK are plug-and-play development kits that let you evaluate our OEM sensors quickly. They are designed to be easy to use, enabling rapid testing of our OEM sensor modules as well as exploring the NIR technology before full product integration.

Features:
USB-C & Ethernet Connectivity
Si-Spect software for controlling sensors and collecting spectra
Sampling Accessories for Liquids, powders and solids

Si-NIR Mini and Matrix Development Kits, two compact scientific devices with USB-C ports and a circular sensor on the Matrix kit.

Need to deploy Real-Time material Analysis In-line/On-line?
Meet Si-NIR StreamLine

Si-NIR StreamLine is a rugged inline/online fourier transform near infrared analysis device, ready to be deployed for continuous material composition monitoring in production lines, processing facilities, and outdoor field stations.

Continuous inline process monitoring

Real-time composition measurement

Multi-point or multi-line industrial deployments

Rugged environments

Lab-grade FT-NIR spectroscopy

One-second scans for real-time decision-making

Wi-Fi and/or Ethernet connectivity

Rugged, sealed industrial design for harsh environments

Enterprise-wide deployment across multiple sites

Various parameters in one scan

Accelerate Evaluation and Model Development with
Si-Spect Software

Si-Spect is the unified desktop software for all Si-Ware products

Use Si-Spect To:

Control sensors and analyzers
Collect and visualize spectra
Manage datasets and compare measurements
Use spectral data to build & train models

Computer screen showing a Si-Ware Systems spectroscopy software interface with a graph titled Background plotting Power Spectral Density vs Wavelength, and sensor and scan settings panels.

Engineering Support throughout Your Development Cycle

We partner with your team throughout the development cycle of material analysis solutions, from initial evaluation to full deployment.

We Can Help You:
Choose from & evaluate our NIR solutions for you specific application
Customize & integrate NIR material analysis into your products, instruments, and automation systems
Get guidance on electrical, optical, and mechanical integration
Optimize performance for your specific application.
Scale your material analysis capabilities for mass production 
Build Models and integrate them into our Si-Spect software.

Three engineers in a lab analyzing a circuit board and a microchip with technical equipment and a laptop displaying a colorful graph.

A Solution for Every Stage

Evaluate

Using Si-NIR Mini & Matrix DVKs

Integrate

With Si-NIR Mini & Matrix OEM Sensors

Deploy

With Si-NIR StreamLine & Integrated Solutions

Connect With Our Experts to Start Your Material Analysis Journey Today!

Our team will follow up with personalized guidance to help you choose the right sensor and solution for your application. You will also receive detailed information about our product offerings, services, and available programs.