Si-NIR OverLine
Rugged FT-NIR for contactless continuous analysis of materials in motion
What Is
Si-NIR OverLine
sensor ?
Si-NIR OverLine is a contactless FT-NIR spectral sensing device designed for continuous analysis of material composition from a distance without interrupting flow or requiring physical contact. Featuring built-in self-calibration, it delivers reliable real-time data with minimal human intervention, even in environments where traditional sampling methods are impractical and uptime is critical. This configuration enables continuous, non-intrusive monitoring of materials in motion or when the sensor is mounted on moving equipment.
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Key Features & Advantages
√ Analysis from a distance without touching the sample
√ Continuous operation
√ Speedy response
√ Built-in self-reference for unmanned calibration
Material Analysis Capabilities
Homogeneous Solids: powders, ground solids, textiles, fibers, thin films, plastic, leaves
Non homogeneous solids: granular solids, resins, blends, pellets
Liquids: opaque liquids
Diffuse reflectance
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Integration & installation Environments
Bring lab-grade spectral analysis to real-world system integration
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technical specifications
1,350 - 2,500 nm
Built-in light source and light collector for measurement at a distance (15 cm) without touching the sample
>2,000:1
16 nm
Extended InGaAs
Ethernet, Wi-Fi
W 278 × L 145 × H 145 mm3
2 kg
Si-Spect, PLC
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Product Related Resources
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